X-Ray Fluorescence Cross-Sections Measurement

Abstract

The technique of X-ray fluorescence (XRF) system has been applied to the cross-sections measurements. In XRFA, source of X-ray photon (Cd-l09 with excitation energy 22.1 keV) is used to excite characteristic X-ray emission in the samples. The system consists of a Lithium-drifted Silicon detector to detect fraction of the X- rays emitted from the sample. The calibration of X-ray fluorescence spectrometer has been accomplished using thin standard samp1es. Absolute values of K and L X-ray fluorescence (XRF) cross- sections have been calculated at excitation energy corresponding to Cd-109 radioisotope source. Measurements were also made for these cross-sections at excitation energy from Cd-109 source. Both calculated and measured cross- sections have been carried out for, elements with ( ) for K -lines and the elements with ( ) for L - lines. A comparative study of the calculated and measured values of XRF cross-sections agree within 2 % - 10 %.